Poster (Call for Papers)
November 24-27, 2009
(Credits: Reneta Barneva, Joaquin Carbonara, Francois de Vieilleville, Kostadin Koroutchev, Andrew Parker)
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IWCIA’08 is the twelfth of a series of international meetings on combinatorial image analysis. It will take place in Buffalo, NY, USA, April 7-9, 2008. Previous meetings were held in Paris (France) 1991, Ube (Japan) 1992, Washington DC (USA) 1994, Lyon (France) 1995, Hiroshima (Japan) 1997, Madras (India) 1999, Caen (France, 2000), Philadelphia (USA, 2001), Palermo (Italy, 2003), Auckland (New Zealand, 2004) and Berlin (Germany, 2006).
Image analysis is a scientific discipline providing theoretical foundations and methods for solving problems appearing in a wide range of areas, as diverse as medicine, robotics, defense, and security. As a rule, the processed data are discrete; therefore, the "discrete approach" to image analysis appears to be a natural one and has an increasing importance. It is based on studying combinatorial properties of the considered digital data sets. Combinatorial image analysis often features various advantages (in terms of efficiency and accuracy) over the more traditional approaches based on continuous models requiring numeric computation.
The scientific program of the workshop consists of keynote addresses, contributed papers presented in two parallel sessions, and posters.
An opening talk will be given by the special guest of IWCIA'08, Dr. Herbert A. Hauptman (Nobel Laureate, President of the Hauptman-Woodward Medical Research Institute). Keynote talks will be given by Prof. Jake K. Aggarwal, University of Texas at Austin, Prof. Polina Golland, Massachusetts Institute of Technology, and Prof. Arie E. Kaufman, SUNY Stony Brook. A closing talk will be given by Prof. Gabor T. Herman, Graduate Center, the City University of New York.
The workshop proceedings are published in the Springer’s "Lecture Notes in Computer Science" series, LNCS 4958.
After the Workshop, the authors of the best ranked papers will be invited to submit extended versions of their works for publication in a special issue of Pattern Recognition (Elsevier).
The Workshop is a forum for current research on topics such as the following:
The accepted papers are published by Research Publishing Services. After the Workshop, the authors of the best ranked papers will be invited to submit extended versions of their works for publication in a special issue of the International Journal of Imaging Systems and Technology (Wiley) and possibly in special issues of other journals.