IWCIA'08 Logo
 

• General Information
• Important Dates
• Keynote Speakers
• Committees
• Paper Submission
• Registration Procedure
• Venue
• Scientific Program
• Journal Publications
• Social Program
• Useful Links
• Printable View
• Poster (Call for Papers)
• Contact us


Sponsors:





IWCIA'09 will be held in Mexico
November 24-27, 2009


Pictures from IWCIA'08 are available here.
(Credits: Reneta Barneva, Joaquin Carbonara, Francois de Vieilleville, Kostadin Koroutchev, Andrew Parker)

Click here to download all pictures (93 MB).

Scope

IWCIA’08 is the twelfth of a series of international meetings on combinatorial image analysis. It will take place in Buffalo, NY, USA, April 7-9, 2008. Previous meetings were held in Paris (France) 1991, Ube (Japan) 1992, Washington DC (USA) 1994, Lyon (France) 1995, Hiroshima (Japan) 1997, Madras (India) 1999, Caen (France, 2000), Philadelphia (USA, 2001), Palermo (Italy, 2003), Auckland (New Zealand, 2004) and Berlin (Germany, 2006).

Image analysis is a scientific discipline providing theoretical foundations and methods for solving problems appearing in a wide range of areas, as diverse as medicine, robotics, defense, and security. As a rule, the processed data are discrete; therefore, the "discrete approach" to image analysis appears to be a natural one and has an increasing importance. It is based on studying combinatorial properties of the considered digital data sets. Combinatorial image analysis often features various advantages (in terms of efficiency and accuracy) over the more traditional approaches based on continuous models requiring numeric computation.

The scientific program of the workshop consists of keynote addresses, contributed papers presented in two parallel sessions, and posters.

An opening talk will be given by the special guest of IWCIA'08, Dr. Herbert A. Hauptman (Nobel Laureate, President of the Hauptman-Woodward Medical Research Institute). Keynote talks will be given by Prof. Jake K. Aggarwal, University of Texas at Austin, Prof. Polina Golland, Massachusetts Institute of Technology, and Prof. Arie E. Kaufman, SUNY Stony Brook. A closing talk will be given by Prof. Gabor T. Herman, Graduate Center, the City University of New York.

The workshop proceedings are published in the Springer’s "Lecture Notes in Computer Science" series, LNCS 4958.

LNCS logo Springer logo

After the Workshop, the authors of the best ranked papers will be invited to submit extended versions of their works for publication in a special issue of Pattern Recognition (Elsevier).

Topics

The Workshop is a forum for current research on topics such as the following:
  • Combinatorial problems in the discrete plane and space related to image analysis; lattice polygons and polytopes
  • Discrete/combinatorial geometry and topology and their use in image analysis
  • Digital geometry of curves and surfaces
  • Tilings and patterns; combinatorial pattern matching
  • Image representation, segmentation, grouping, and reconstruction
  • Methods for image compression
  • Discrete tomography
  • Applications of integer programming, linear programming, and computational geometry to problems of image analysis
  • Parallel architectures and algorithms for image analysis
  • Fuzzy and stochastic image analysis
  • Grammars and models for image or scene analysis and recognition; cellular automata
  • Mathematical morphology and its applications to image analysis
  • Applications in medical imaging, biometrics, and others
The submitted papers met very high standards satisfying serious evaluation criteria. Each paper was thoroughly reviewed by at least three referees. Double-blind review process ensured maximal objectiveness.


  • Special Track on Applications
In addition to the theoretical research papers, a special track on applications is organized for first time as a part of IWCIA’08. Authors submitted original papers describing in detail working computer systems for image analysis. The criteria for acceptance were originality, efficiency and overall performance of the computer system.

The accepted papers are published by Research Publishing Services. After the Workshop, the authors of the best ranked papers will be invited to submit extended versions of their works for publication in a special issue of the International Journal of Imaging Systems and Technology (Wiley) and possibly in special issues of other journals.

Volumes